[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Unipolar resistive switching and retention of RTA-treated zinc oxide (ZnO) resistive RAM
Cheng-Li Lin,, Shu-Ching Wu,, Chi-Chang Tang,, Yi-Hsiu Lai,, Syuan-Ren Yang,, Shich-Chuan Wu,Year:
2011
Language:
english
DOI:
10.1109/ipfa.2011.5992754
File:
PDF, 1.35 MB
english, 2011