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Accurate Determination of Shallow Zn-Diffusion Profiles in GaP and GaAs[sub 0.1]P[sub 0.9] Using Anodic Oxidation and a Double Radioactive Tracer Technique
Verplanke, J. C.Volume:
124
Year:
1977
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.2133328
File:
PDF, 322 KB
english, 1977