[IEEE 2004 IEEE International Workshop on Current and Defect Based Testing - Napa Valley, CA, USA (25 April 2004)] Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004) - Comparison of wafer-level spatial I/sub DDQ/ estimation methods: NNR versus NCR
Sabade, S.S., Walker, D.M.H.Year:
2004
Language:
english
DOI:
10.1109/dbt.2004.1408947
File:
PDF, 351 KB
english, 2004