[IEEE 2009 IEEE International Test Conference (ITC) -...

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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study

Goel, Sandeep Kumar, Devta-Prasanna, Narendra, Ward, Mark
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Year:
2009
Language:
english
DOI:
10.1109/test.2009.5355762
File:
PDF, 289 KB
english, 2009
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