[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study
Goel, Sandeep Kumar, Devta-Prasanna, Narendra, Ward, MarkYear:
2009
Language:
english
DOI:
10.1109/test.2009.5355762
File:
PDF, 289 KB
english, 2009