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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - A background calibration technique for fully dynamic flash ADCs
Yun-Shiang Shu,, Jui-Yuan Tsai,, Ping Chen,, Tien-Yu Lo,, Pao-Cheng Chiu,Year:
2013
Language:
english
DOI:
10.1109/vldi-dat.2013.6533857
File:
PDF, 816 KB
english, 2013