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Benefits of a SoC-specific test methodology
Quasem, Md.Saffat, Zhigang Jiang,, Gupta, S.K.Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1198688
Date:
May, 2003
File:
PDF, 272 KB
english, 2003