Benefits of a SoC-specific test methodology

IEEE Design & Test of Computers 2003 / 05 Vol. 20; Iss. 3

Benefits of a SoC-specific test methodology

Quasem, Md.Saffat, Zhigang Jiang,, Gupta, S.K.
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Volume:
20
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2003.1198688
Date:
May, 2003
File:
PDF, 272 KB
english, 2003
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