[IEEE 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) - Hsinchu, Taiwan (27-29 April 2005)] 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). - A multilevel sensing and program verifying scheme for Bi-HAND flash memories
Chiu-Chiao Chung,, Hongchin Lin,, You-Min Shen,, Yen-Tai Lin,Year:
2005
Language:
english
DOI:
10.1109/vdat.2005.1500072
File:
PDF, 652 KB
english, 2005