Models and Algorithmic Limits for an ECC-Based Approach to...

IEEE Transactions on Nuclear Science 2007 / 08 Vol. 54; Iss. 4

Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

Bajura, Michael A., Boulghassoul, Younes, Naseer, Riaz, DasGupta, Sandeepan, Witulski, Arthur F., Sondeen, Jeff, Stansberry, Scott D., Draper, Jeffrey, Massengill, Lloyd W., Damoulakis, John N.
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2007.892119
Date:
August, 2007
File:
PDF, 301 KB
english, 2007
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