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[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Impact of I/O buffer configuration on the ESD performance of a 0.5 /spl mu/m CMOS process
Nikolaidis, T., Papadas, C., Varrot, M., Mortini, P., Pananakakis, G.Year:
1995
Language:
english
DOI:
10.1109/eosesd.1995.478266
File:
PDF, 520 KB
english, 1995