![](/img/cover-not-exists.png)
[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics
Kim, Young Moon, Seomun, Jun, Kim, Hyung-Ock, Do, Kyung-Tae, Choi, Jung Yun, Kim, Kee Sup, Sauer, Matthias, Becker, Bernd, Mitra, SubhasishYear:
2013
Language:
english
DOI:
10.1109/cicc.2013.6658544
File:
PDF, 219 KB
english, 2013