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[IEEE 2007 International Symposium on Electromagnetic Compatibility - Qingdao, China (2007.10.23-2007.10.26)] 2007 International Symposium on Electromagnetic Compatibility - Influence of Parameters of the Transient Grounding Model on Numerical Analysis and Experimental Verification

Hongbing, He, Bihua, Zhou, Jiaqing, Chen
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Year:
2007
Language:
english
DOI:
10.1109/elmagc.2007.4413423
File:
PDF, 559 KB
english, 2007
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