Degradation of solid dielectrics due to internal partial...

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IEEE Transactions on Dielectrics and Electrical Insulation 2005 / 12

Degradation of solid dielectrics due to internal partial discharge: some thoughts on progress made and where to go now

Wang, Haitang, Agrawal, Dharma P., Zeng, Qing-An
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Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2005.1561811
Date:
December, 2005
File:
PDF, 30 KB
2005
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