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[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Reducing embedded software radiation-induced failures through cache memories
Santini, Thiago, Rech, Paolo, Nazar, Gabriel, Carro, Luigi, Wagner, Flavio RechYear:
2014
Language:
english
DOI:
10.1109/ets.2014.6847793
File:
PDF, 396 KB
english, 2014