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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Characterization on ESD devices with test structures in silicon germanium RF BiCMOS process
Ming-Dou Ker,, Woei-Lin Wu,, Chyh-Yih Chang,Year:
2004
Language:
english
DOI:
10.1109/icmts.2004.1309292
File:
PDF, 363 KB
english, 2004