[IEEE 2008 9th International Conference on Solid-State and...

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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Noise in nano-scale MOSFETs and flash cells

Hyungcheol Shin,, Yang, Seungwon, Jongwook Jeon,, Daewoong Kang,
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Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734478
File:
PDF, 2.78 MB
english, 2008
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