[IEEE 2011 International Conference on Biometrics and Kansei Engineering (ICBAKE) - Takamatsu, Japan (2011.09.19-2011.09.22)] 2011 International Conference on Biometrics and Kansei Engineering - An Improved Method of Sequential Probability Ratio Test for Change Point Detection in Time Series
Kihara, Shiro, Shimizu, Yoshio, Morikawa, Nobuhiko, Hattori, TetsuoYear:
2011
Language:
english
DOI:
10.1109/icbake.2011.48
File:
PDF, 336 KB
english, 2011