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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Stress-Induced Mobility Enhancement for Integrated Power Transistors
Moens, P., Roig, J., Clemente, F., De Wolf, I., Desoete, B., Bauwens, F., Tack, M.Year:
2007
Language:
english
DOI:
10.1109/iedm.2007.4419089
File:
PDF, 4.08 MB
english, 2007