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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - Timing error tolerance in nanometer ICs
Valadimas, S., Tsiatouhas, Y., Arapoyanni, A.Year:
2010
Language:
english
DOI:
10.1109/iolts.2010.5560189
File:
PDF, 315 KB
english, 2010