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[IEEE 2002 IEEE International SOI Conference - Williamsburg, VA, USA (2002.10.10-2002.10.10)] IEEE International SOI Conference SOI-02 - Hot-carrier-induced degradation on 0.1 /spl mu/m SOI CMOSFET

Wen-Kuan Yeh,, Wen-Han Wang,, Yean-Kuen Fang,, Fu-Liang Yang,
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Year:
2002
Language:
english
DOI:
10.1109/soi.2002.1044438
File:
PDF, 172 KB
english, 2002
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