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[IEEE amp; Management Symposium (SEMI-THERM) - Santa Clara, CA (2010.02.21-2010.02.25)] 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Interaction of scaling trends in processor architecture and cooling
Wei Huang,, Stan, Mircea R, Gurumurthi, Sudhanva, Ribando, Robert J, Skadron, KevinYear:
2010
Language:
english
DOI:
10.1109/stherm.2010.5444290
File:
PDF, 742 KB
english, 2010