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[IEEE Comput. Soc IEEE European Test Workshop - Cascais, Portugal (23-26 May 2000)] Proceedings IEEE European Test Workshop - Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M., Cibakova, T., Gramatova, E., Kuzmicz, W., Lobur, M., Pleskacz, W., Raik, J., Ubar, R.Year:
2000
Language:
english
DOI:
10.1109/etw.2000.873781
File:
PDF, 585 KB
english, 2000