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[IEEE Comput. Soc Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - RUNE: platform for automated design of integrated multi-domain systems application to high-speed CMOS photoreceiver front-ends
Tissafi-Drissi, F., O'Connor, I., Gaffiot, F.Year:
2004
Language:
english
DOI:
10.1109/date.2004.1269191
File:
PDF, 321 KB
english, 2004