Dose and dose-rate effects on NPN bipolar junction transistors irradiated at high temperature
Boch, J., Saigne, E., Maurel, T., Giustino, F., Dusseau, L., Schrimpf, R.D., Galloway, K.F., David, J.P., Ecoffet, R., Fesquet, J., Gasiot, J.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039686
Date:
June, 2002
File:
PDF, 245 KB
english, 2002