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[IEEE 2004 International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (17-20 May 2004)] 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) - Investigation of nano interconnects for an early experimental assessment of future interconnect challenges
Engelhardt, N., Schindler, G., Steinhogl, W., Steinlesberger, G., Traving, M.Year:
2004
Language:
english
DOI:
10.1109/icicdt.2004.1309921
File:
PDF, 315 KB
english, 2004