[IEEE 2012 International Symposium on VLSI Design,...

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[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - High speed DDR2/3 PHY and dual CPU core design for 28nm SoC

Ho, Kevin, Tsung-Yi Chou,, Po-Kai Chen,, Liou, D. J.
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Year:
2012
Language:
english
DOI:
10.1109/vlsi-dat.2012.6212637
File:
PDF, 523 KB
english, 2012
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