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[IEEE 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Demonstration of chip level writability, endurance and data retention of an entire 8Mb STT-MRAM array
Lee, Y. J., Jan, G., Wang, Y. J., Pi, K., Zhong, T., Tong, R. Y., Lam, V., Teng, J., Huang, K., He, R. R., Le, S., Torng, T., DeBrosse, J., Maffitt, T., Long, C., Gallagher, W. J., Wang, P. K.Year:
2013
Language:
english
DOI:
10.1109/vlsi-tsa.2013.6545595
File:
PDF, 644 KB
english, 2013