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[IEEE Comput. Soc Record of the 2000 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (7-8 Aug. 2000)] Records of the IEEE International Workshop on Memory Technology, Design and Testing - Design techniques for embedded EEPROM memories in portable ASIC and ASSP solutions
Daga, J.M., Papaix, C., Merandat, M., Ricard, S., Medulla, G., Guichaoua, J., Auvergne, D.Year:
2000
Language:
english
DOI:
10.1109/mtdt.2000.868614
File:
PDF, 546 KB
english, 2000