![](/img/cover-not-exists.png)
[IEEE 2013 IEEE CPMT Symposium Japan (Formerly VLSI Packaging Workshop of Japan) - Kyoto, Japan (2013.11.11-2013.11.13)] 2013 3rd IEEE CPMT Symposium Japan - Nondestructive observation of fatigue crack propagation process in some solder joints by synchrotron radiation X-ray micro-tomography
Tsuritani, Hiroyuki, Sayama, Toshihiko, Uesugi, Kentaro, Okamoto, Yoshiyuki, Takayanagi, Takeshi, Mori, TakaoYear:
2013
Language:
english
DOI:
10.1109/icsj.2013.6756130
File:
PDF, 569 KB
english, 2013