![](/img/cover-not-exists.png)
[IEEE 2011 IEEE 6th International Design and Test Workshop (IDT) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 IEEE 6th International Design and Test Workshop (IDT) - Adjustable supply voltages and refresh cycle for process variations, temperature changes, and device degradation adaptation in 1T1C embedded DRAM
Tran, Le-Nguyen, Kurdahi, Fadi J., Eltawil, Ahmed M., Aljumah, AbdullahYear:
2011
Language:
english
DOI:
10.1109/idt.2011.6123115
File:
PDF, 727 KB
english, 2011