[IEEE 2007 IEEE 19th International Conference on Indium Phosphide & Related Materials - Matsue, Japan (2007.05.14-2007.05.18)] 2007 IEEE 19th International Conference on Indium Phosphide & Related Materials - Study of Failure Mechanisms in InP/GaAsSb/InP DHBT Under Bias and Thermal Stress
Grandchamp, B., Maneux, C., Labat, N., Touboul, A., Bove, Ph., Riet, M., Godin, J., Scavennec, A.Year:
2007
Language:
english
DOI:
10.1109/iciprm.2007.381212
File:
PDF, 3.21 MB
english, 2007