![](/img/cover-not-exists.png)
[IEEE 5th International Conference on Properties and Applications of Dielectric Materials - Seoul, South Korea (25-30 May 1997)] Proceedings of 5th International Conference on Properties and Applications of Dielectric Materials - Investigation of basic optical characteristics in Te-Ge binary thin films for the optical memory
Young-Jong Lee,, Hong-Seok Kim,, Hong-Bay Chung,Volume:
2
Year:
1997
Language:
english
DOI:
10.1109/icpadm.1997.616514
File:
PDF, 268 KB
english, 1997