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[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - Using boundary scan test to test random access memory clusters

Muris, M., Biewenga, A.
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Year:
1993
Language:
english
DOI:
10.1109/test.1993.470704
File:
PDF, 456 KB
english, 1993
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