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[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A consistent and scalable PSPICE HFET-Model for DC- and S-parameter-simulation
Ehrich, S., Bertenburg, R.M., Agethen, M., Brennemann, A., Brockerhoff, W., Tegude, F.-J.Year:
2002
Language:
english
DOI:
10.1109/icmts.2002.1193173
File:
PDF, 161 KB
english, 2002