[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study
Beck, M., Barondeau, O., Poehl, F., Xijiang Lin,, Press, R.Year:
2005
Language:
english
DOI:
10.1109/vts.2005.54
File:
PDF, 169 KB
english, 2005