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[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Opportunities in System testing
Bahulkar, Arun, Kelkar, RahulYear:
2007
Language:
english
DOI:
10.1109/taic.part.2007.18
File:
PDF, 255 KB
english, 2007