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[IEEE 2005 European Microwave Conference - Paris, France (2005.10.4-2005.10.6)] 2005 European Microwave Conference - Electromechanical resonances of SiC and AlN beams under ambient conditions
Brueckner, K., Forster, Ch., Tonisch, K., Cimalla, V., Ambacher, O., Stephan, R., Blau, K., Hein, M.A.Year:
2005
Language:
english
DOI:
10.1109/eumc.2005.1610243
File:
PDF, 917 KB
english, 2005