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[IEEE 2011 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2011.05.16-2011.05.18)] 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Embedded memory fail analysis for production yield enhancement
Baltagi, Youssef, Rosi, Daniele Li, Tancorre, Vincenzo, Garagnon, Christophe, Faehn, Eric, Barone, Mario, Appello, Davide, Suzor, ChristopheYear:
2011
Language:
english
DOI:
10.1109/asmc.2011.5898161
File:
PDF, 939 KB
english, 2011