[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Ageing under illumination of MOS transistors for active pixel sensors (APS) applications
Lopez, Diana, Monsieur, Frederic, Ricq, Stephane, Roux, Julien-Marc, Balestra, FrancisYear:
2008
Language:
english
DOI:
10.1109/irws.2008.4796081
File:
PDF, 2.36 MB
english, 2008