[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of ESSCIRC - All-digital on-chip monitor for PMOS and NMOS process variability measurement utilizing buffer ring with pulse counter
Iizuka, Tetsuya, Jeong, Jaehyun, Nakura, Toru, Ikeda, Makoto, Asada, KunihiroYear:
2010
Language:
english
DOI:
10.1109/esscirc.2010.5619899
File:
PDF, 1.07 MB
english, 2010