[IEEE 2008 17th Asian Test Symposium (ATS) - Hokkaido, Japan (2008.11.24-2008.11.27)] 2008 17th Asian Test Symposium - A Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
Inoue, Ryoichi, Hosokawa, Toshinori, Fujiwara, HideoYear:
2008
Language:
english
DOI:
10.1109/ats.2008.32
File:
PDF, 425 KB
english, 2008