[IEEE 2011 IEEE 17th International Mixed-Signals, Sensors...

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[IEEE 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2011) - Santa Barbara, CA, USA (2011.05.16-2011.05.18)] 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop - Image-Quality-Driven Metrics for Testing and Calibrating ADC Array in CMOS Imagers: A First Step

Chang, Hsiu-Ming Sherman, Cheng, Kwang-Ting Tim, Huang, Jiun-Lang
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Year:
2011
Language:
english
DOI:
10.1109/ims3tw.2011.13
File:
PDF, 284 KB
english, 2011
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