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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
Schwank, James R., Shaneyfelt, Marty R., McMorrow, Dale, Ferlet-Cavrois, Veronique, Dodd, P. E., Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., LaBel, Kenneth A., Rodbell, Kenneth P., HakeYear:
2009
Language:
english
DOI:
10.1109/radecs.2009.5994560
File:
PDF, 879 KB
english, 2009