Comparison of Carrier Lifetime Measurements and Mapping in 4H SiC Using Time Resolved Photoluminscence and μ-PCD
Kallinger, Birgit, Rommel, Mathias, Lilja, Louise, Ul Hassan, Jawad, Booker, Ian D., Janzén, Erik, Bergman, PederVolume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.778-780.301
Date:
February, 2014
File:
PDF, 555 KB
english, 2014