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[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - Comparison of ESD protection capability of SOI and bulk CMOS output buffers
Mansun Chan,, Yuen, S.S., Zhi-Jian Ma,, Hui, K.Y., Ko, P.K., Chenming Hu,Year:
1994
Language:
english
DOI:
10.1109/relphy.1994.307821
File:
PDF, 670 KB
english, 1994