[IEEE 1996 46th Electronic Components and Technology Conference - Orlando, FL, USA (28-31 May 1996)] 1996 Proceedings 46th Electronic Components and Technology Conference - Reliability characterization of the SLICC package
Lall, P., Gold, G., Miles, B., Banerji, K., Thompson, P., Koehler, C., Adhihetty, I.Year:
1996
Language:
english
DOI:
10.1109/ectc.1996.550888
File:
PDF, 1.09 MB
english, 1996