[IEEE International Electron Devices Meeting. Technical...

  • Main
  • [IEEE International Electron Devices...

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - High performance single work-function tungsten gate CMOS devices for gigabit DRAM

Woo-tag Kang,, Gluschenkov, O., Boyong He,, Yujun Li,, Malik, R., Clevenger, L., McStay, I., Robl, W., Vollertsen, R., Masse, G., La Rosa, G., Lee, K., Murthy, C., Parks, C., Mohler, R., Bergner, W
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979402
File:
PDF, 340 KB
english, 2001
Conversion to is in progress
Conversion to is failed