![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2007.12.5-2007.12.6)] 2007 Eighth International Workshop on Microprocessor Test and Verification - On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction
Ravotto, D., Sanchez, E., Schillaci, M., Reorda, M. Sonza, Squillero, G.Year:
2007
Language:
english
DOI:
10.1109/mtv.2007.14
File:
PDF, 237 KB
english, 2007