0.84 ps Resolution Clock Skew Measurement via Subsampling
Amrutur, Bharadwaj, Das, Pratap Kumar, Vasudevamurthy, RajathVolume:
19
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2010.2083706
Date:
December, 2011
File:
PDF, 1.52 MB
english, 2011