[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - A partial scan methodology for testing self-timed circuits
Khoche, A., Brunvand, E.Year:
1995
Language:
english
DOI:
10.1109/vtest.1995.512650
File:
PDF, 711 KB
english, 1995