[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Approximating infinite dynamic behavior for DRAM cell defects
Al-Ars, Z., van de Goor, Ad.J.Year:
2002
Language:
english
DOI:
10.1109/vts.2002.1011171
File:
PDF, 334 KB
english, 2002